GB/T 4937.41-2026

Semiconductor devices—Mechanical and climatic test methods—Part 41Test method for reliability of non-volatile memory devices

NORM herausgegeben am 27.2.2026

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The information about the standard:

Designation standards: GB/T 4937.41-2026
Note: Execute Date: september 2026
Publication date standards: 27.2.2026
Country: Chinese technical standard
Kategorie: Technische Normen GB