GB/T 6624-2009

Standard method for measuring the surface quality of polished silicon slices by visual inspection

NORM herausgegeben am 30.10.2009

English, Chinesisch -
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The information about the standard:

Designation standards: GB/T 6624-2009
Publication date standards: 30.10.2009
Country: Chinese technical standard
Kategorie: Technische Normen GB