IEC 60749-31-ed.1.0

Die Annotation des Normtextes IEC 60749-31-ed.1.0 :

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy. Applicable aux dispositifs a semiconducteurs (dispositifs discrets et circuits integres), cet essai determine si le dispositif prend feu par suite dun echauffement interne du a des surcharges excessives. Le contenu du corrigendum daout 2003 a ete pris en consideration dans cet exemplaire.