Printed electronics - Part 503-3: Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method

Informationen über die Norm:

Bezeichnung normen: IEC 62899-503-3-ed.1.0
Ausgabedatum normen: 24.8.2021
Zahl der Seiten: 13
Gewicht ca.: 39 g (0.09 Pfund)
Land: Internationale technische Norm
Kategorie: Technische Normen IEC

Die Annotation des Normtextes IEC 62899-503-3-ed.1.0 :

IEC 62899-503-3:2021(E) specifies a measuring method of contact resistance for printed thin film transistors (TFTs) by the transfer length method (TLM). The method requires the fabrication of a test element group (TEG) with varying channel length (L) between source and drain electrodes. The method is intended for quality assessment of TFT electrode contacts and is suited for determining whether the contact resistance lies within a desired range.