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IEC 62951-8-ed.1.0

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

NORM herausgegeben am 19.1.2023

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Informationen über die Norm:

Bezeichnung normen: IEC 62951-8-ed.1.0
Ausgabedatum normen: 19.1.2023
Zahl der Seiten: 14
Gewicht ca.: 42 g (0.09 Pfund)
Land: Internationale technische Norm
Kategorie: Technische Normen IEC

Die Annotation des Normtextes IEC 62951-8-ed.1.0 :

IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include experimental procedures and the equipment to be used. It also includes general requirements for test conditions such as the temperature and relative humidity of the testing environment. The test method described in this document focuses on stability evaluation rather than reliability.