EMC IC modelling - Part 4-1: Use of ICIM-CI model to predict the IC conducted immunity in a PCB
NORM herausgegeben am 26.8.2025
Bezeichnung normen: IEC/TR 62433-4-1-ed.1.0
Ausgabedatum normen: 26.8.2025
Zahl der Seiten: 40
Gewicht ca.: 120 g (0.26 Pfund)
Land: Internationale technische Norm
Kategorie: Technische Normen IEC
IEC TR 62433-4-1:2025 provides an overview of good practices to extract an ICIM-CI model from measurements and to build a numerical model of the PCB in which the ICIM-CI model is used to predict RF immunity of an IC in its application PCB. This document also discusses factors which can be considered to obtain proper results in an ICIM-CI model extraction and use of the actual model at the PCB level.