IEEE 1181-1991

IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated- Circuit Process Characterization

NORM herausgegeben am 13.12.1991

Englisch -
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The information about the standard:

Designation standards: IEEE 1181-1991
Note: UNGÜLTIG
Publication date standards: 13.12.1991
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Kategorie: Technische Normen IEEE