IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
NORM herausgegeben am 12.10.2022
Bezeichnung normen: IEEE 1500-2022
Ausgabedatum normen: 12.10.2022
Zahl der Seiten: 168
Gewicht ca.: 535 g (1.18 Pfund)
Land: Internationale technische Norm
Kategorie: Technische Normen IEEE
Revision Standard - Active.
A mechanism for the test of core designs within a system on chip (SoC) is defined. This mechanism is a hardware architecture and the core test language (CTL) is leveraged to facilitate communication between core designers and core integrators.
ISBN: 978-1-5044-8866-2, 978-1-5044-8867-9
Number of Pages: 168
Product Code: STD25531, STDPD25531
Keywords: core test, embedded core test, IEEE 1500, IP test, test reuse
Category: Test Technology