IEEE 1505.1-2008

IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

NORM herausgegeben am 1.8.2013

Englisch -
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The information about the standard:

Designation standards: IEEE 1505.1-2008
Note: UNGÜLTIG
Publication date standards: 1.8.2013
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Kategorie: Technische Normen IEEE