IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
NORM herausgegeben am 30.12.2015
Bezeichnung normen: IEEE/IEC 63003-2015
Ausgabedatum normen: 30.12.2015
Zahl der Seiten: 175
Gewicht ca.: 556 g (1.23 Pfund)
Land: Internationale technische Norm
Kategorie: Technische Normen IEEE
Adoption Standard - Active.
This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).
ISBN: 978-1-5044-0580-5, 978-1-5044-0603-1
Number of Pages: 175
Product Code: STD20742, STDPD20742
Keywords: ATE, ATS, fixture, ICD, IEEE 1505.1(TM), interface, ITA, mass termination, receiver, scalable, TPS, UUT
Category: Design Automation|Test Instrumentation and Techniques