JIS C5630-2:2009

Semiconductor devices -- Micro-electromechanical devices-- Part 2: Tensile testing method of thin film materials

NORM herausgegeben am 20.3.2009

Japanisch -
Elektronische PDF (AUF ANFRAGE)

The information about the standard:

Designation standards: JIS C5630-2:2009
Publication date standards: 20.3.2009
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: Other standards
Kategorie: Technische Normen JIS