
Semiconductor devices -- Micro-electromechanical devices-- Part 3: Thin film standard test piece for tensile testing
NORM herausgegeben am 20.3.2009
Designation standards: JIS C5630-3:2009
Publication date standards: 20.3.2009
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: Other standards
Kategorie: Technische Normen JIS