JIS H0602:1995

Testing method of resistivity for silicon crystals and silicon wafers with four-point probe

NORM herausgegeben am 30.11.1995

The information about the standard:

Designation standards: JIS H0602:1995
Publication date standards: 30.11.1995
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: Other standards
Kategorie: Technische Normen JIS