JIS H0614:1996

Visual inspection for silicon wafers with specular surfaces

NORM herausgegeben am 31.1.1996

The information about the standard:

Designation standards: JIS H0614:1996
Publication date standards: 31.1.1996
The number of pages: 8
Approximate weight : 24 g (0.05 lbs)
Country: Other standards
Kategorie: Technische Normen JIS