JIS K0149-1:2019

Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

NORM herausgegeben am 20.11.2019

The information about the standard:

Designation standards: JIS K0149-1:2019
Publication date standards: 20.11.2019
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: Other standards
Kategorie: Technische Normen JIS