Surface chemical analysis -- Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
NORM herausgegeben am 20.7.2009
Designation standards: JIS K0160:2009
Publication date standards: 20.7.2009
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: Other standards
Kategorie: Technische Normen JIS