STN EN 60749-2 (358799)

Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure

NORM herausgegeben am 1.2.2003

The information about the standard:

Designation standards: STN EN 60749-2
Classification mark: 358799
Catalog number: 89303
Publication date standards: 1.2.2003
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: Slovak technical standard
Kategorie: Technische Normen STN