STN EN 60749-3 (358799)

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

NORM herausgegeben am 1.10.2017

The information about the standard:

Designation standards: STN EN 60749-3
Classification mark: 358799
Catalog number: 125483
Publication date standards: 1.10.2017
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Kategorie: Technische Normen STN