Semiconductor devices - Mechanical and climatic test methods Part 35: Acoustic microscopy for plastic encapsulated electronic components
NORM herausgegeben am 1.6.2007
Designation standards: STN EN 60749-35
Classification mark: 358799
Catalog number: 103750
Publication date standards: 1.6.2007
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: Slovak technical standard
Kategorie: Technische Normen STN