Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
NORM herausgegeben am 1.4.2017
Designation standards: STN EN 60749-44
Classification mark: 358799
Catalog number: 124507
Publication date standards: 1.4.2017
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Kategorie: Technische Normen STN