Semiconductor devices - Micro-electromechanical devices -- Part 8: Strip bending test method for tensile property measurement of thin films
NORM herausgegeben am 1.8.2011
Designation standards: STN EN 62047-8
Classification mark: 358792
Catalog number: 113687
Publication date standards: 1.8.2011
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Kategorie: Technische Normen STN