STN EN IEC 60749-37 (358799)

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

NORM herausgegeben am 1.2.2023

The information about the standard:

Designation standards: STN EN IEC 60749-37
Classification mark: 358799
Catalog number: 136312
Publication date standards: 1.2.2023
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Kategorie: Technische Normen STN