Micrographics — Aperture cards — Method of measuring thickness of buildup area
NORM herausgegeben am 15.7.2003
Designation standards: ISO 6342:2003-ed.2.0
Publication date standards: 15.7.2003
The number of pages: 3
Approximate weight : 9 g (0.02 lbs)
Country: International technical standard
Kategorie: Technische Normen ISO
Description / Abstract: ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.