Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Using SEM Test Methods
NORM herausgegeben am 1.5.2017
Bezeichnung normen: SAE AS6171/2A
Ausgabedatum normen: 1.5.2017
Land: Amerikanische technische Norm
Kategorie: Technische Normen SAE
This document describes the requirements of the following test methods for counterfeit detection of electronic components:a
Method A: General EVI, Sample Selection, and Handling
b
Method B: Detailed EVI, including Part Weight measurement
c
Method C: Testing for Remarking
d
Method D: Testing for Resurfacing
e
Method E: Part Dimensions measurement
f
Method F: Surface Texture Analysis using SEM
The scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
SUBJECT TAXONOMY: Electronic equipment, Risk management, Supplier assessment, Supply chain management, Counterfeit parts, Test procedures, Inspections
SUBFILE: Aerospace
TYPE OF DOCUMENT: Aerospace Standard