
Techniques for Suspect/Counterfeit EEE Parts Detection by X-Ray Fluorescence Test Methods
NORM herausgegeben am 1.6.2022
Bezeichnung normen: SAE AS6171/3
Ausgabedatum normen: 1.6.2022
Land: Amerikanische technische Norm
Kategorie: Technische Normen SAE
XRF technique for counterfeit detection is applicable to electrical, electronic and electromechanical (EEE) parts as listed in AS6171 General Requirements. In general, the detection technique is meant for use on piece parts prior to assembly on a circuit board or on the parts that are removed from a circuit board. The applicability spans a large swath of active, passive and electromechanical parts.
If AS6171/3 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.
SUBJECT TAXONOMY: Electronic equipment, Risk management, Supplier assessment, Counterfeit parts, Test procedures, X-ray inspections
SUBFILE: Aerospace
TYPE OF DOCUMENT: Aerospace Standard