
Environmental Tests and Associated Failure Mechanisms
NORM herausgegeben am 1.9.2014
Bezeichnung normen: SAE SSB1_002
Ausgabedatum normen: 1.9.2014
Land: Amerikanische technische Norm
Kategorie: Technische Normen SAE
This document is an annex to EIA Engineering Bulletin SSB-1, Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military, Aerospace and Other Rugged Applications.
This document provides reference information concerning the environmental stresses associated with tests specifically designed to apply to (or have unique implications for) plastic encapsulated microcircuits and semiconductors, and the specific failures induced by these environmental stresses.
SUBJECT TAXONOMY: Electrical systems, Plastics, Semiconductors
SUBFILE: Aerospace
TYPE OF DOCUMENT: Aerospace Standard
Stabilized: Sep 2014 