Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in January of 2016.)
NORM herausgegeben am 1.11.2025
Designation standards: UNE-EN 15991:2015
Note: UNGÜLTIG
Publication date standards: 1.11.2025
The number of pages: 27
Approximate weight : 81 g (0.18 lbs)
Country: Spanish technical standard
Kategorie: Technische Normen UNE