UNE-EN 60749-18:2003

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

NORM herausgegeben am 21.11.2003

The information about the standard:

Designation standards: UNE-EN 60749-18:2003
Note: UNGÜLTIG
Publication date standards: 21.11.2003
The number of pages: 34
Approximate weight : 102 g (0.22 lbs)
Country: Spanish technical standard
Kategorie: Technische Normen UNE