
Semiconductor devices - Mechanical and climatic test methods -- Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
NORM herausgegeben am 11.6.2004
Designation standards: UNE-EN 60749-20:2004
Note: UNGÜLTIG
Publication date standards: 11.6.2004
The number of pages: 57
Approximate weight : 171 g (0.38 lbs)
Country: Spanish technical standard
Kategorie: Technische Normen UNE