Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006) (Endorsed by AENOR in November of 2006.)
NORM herausgegeben am 1.11.2006
Designation standards: UNE-EN 60749-27:2006
Publication date standards: 1.11.2006
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: Spanish technical standard
Kategorie: Technische Normen UNE