UNE-EN 60749-29:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test

NORM herausgegeben am 9.7.2004

The information about the standard:

Designation standards: UNE-EN 60749-29:2004
Note: UNGÜLTIG
Publication date standards: 9.7.2004
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: Spanish technical standard
Kategorie: Technische Normen UNE