Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (Endorsed by Asociación Espanola de Normalización in July of 2017.)
NORM herausgegeben am 1.7.2017
Designation standards: UNE-EN 60749-3:2017
Publication date standards: 1.7.2017
The number of pages: 21
Approximate weight : 63 g (0.14 lbs)
Country: Spanish technical standard
Kategorie: Technische Normen UNE