UNE-EN 60749-38:2008

Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)

NORM herausgegeben am 1.9.2008

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The information about the standard:

Designation standards: UNE-EN 60749-38:2008
Publication date standards: 1.9.2008
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: Spanish technical standard
Kategorie: Technische Normen UNE