UNE-EN 60749-4:2003

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

NORM herausgegeben am 30.5.2003

The information about the standard:

Designation standards: UNE-EN 60749-4:2003
Note: UNGÜLTIG
Publication date standards: 30.5.2003
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: Spanish technical standard
Kategorie: Technische Normen UNE