Semiconductor devices - Micro-electromechanical devices -- Part 3: Thin film standard test piece for tensile testing (IEC 62047-3:2006) (Endorsed by AENOR in January of 2007.)
NORM herausgegeben am 1.1.2007
Designation standards: UNE-EN 62047-3:2006
Publication date standards: 1.1.2007
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: Spanish technical standard
Kategorie: Technische Normen UNE