Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)
NORM herausgegeben am 1.3.2011
Designation standards: UNE-EN 62374-1:2010
Publication date standards: 1.3.2011
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: Spanish technical standard
Kategorie: Technische Normen UNE