UNE-EN 62415:2010

Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)

NORM herausgegeben am 1.9.2010

The information about the standard:

Designation standards: UNE-EN 62415:2010
Publication date standards: 1.9.2010
The number of pages: 14
Approximate weight : 42 g (0.09 lbs)
Country: Spanish technical standard
Kategorie: Technische Normen UNE