UNE-EN 62418:2010

Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)

NORM herausgegeben am 1.10.2010

The information about the standard:

Designation standards: UNE-EN 62418:2010
Publication date standards: 1.10.2010
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: Spanish technical standard
Kategorie: Technische Normen UNE