Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Espanola de Normalización in May of 2022.)
NORM herausgegeben am 1.5.2022
Designation standards: UNE-EN IEC 60749-28:2022
Publication date standards: 1.5.2022
The number of pages: 57
Approximate weight : 171 g (0.38 lbs)
Country: Spanish technical standard
Kategorie: Technische Normen UNE