Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (Endorsed by Asociación Espanola de Normalización in January of 2023.)
NORM herausgegeben am 1.1.2023
Designation standards: UNE-EN IEC 60749-37:2022
Publication date standards: 1.1.2023
The number of pages: 29
Approximate weight : 87 g (0.19 lbs)
Country: Spanish technical standard
Kategorie: Technische Normen UNE