ASTM E3001-20

5.1 This practice establishes the basic structure for education in the characterization of nanoscale materials at the undergraduate college level. The approach taken is to classify specific characterization methods into two tiers, with a minimum number of methods to be selected from each tier and taught at an in-depth or introductory level. This offers the flexibility of tailoring to regional industry needs while still retaining a high degree of equivalency in educational depth and breadth across geographical boundaries.

5.2 Workers may transition in their roles in the workplace. Participants in such education will have a broad understanding of a complement of characterization methods, thus increasing their marketability for jobs within as well as beyond the nanotechnology field.

5.3 This practice is intended to be one in a series of standards developed for workforce education in various aspects of nanotechnology. It will assist in providing an organization a basic structure for developing a program applicable to many areas in nanotechnology, thus providing dynamic and evolving workforce education.

1.1 This practice describes a procedure to provide the basic education of characterization methods for nanometer-scale materials, to be taught at an undergraduate college level. This education should be broad and include a suite of characterization methods to prepare an individual to work in various capacities within one of the many areas in nanotechnology research, development, or manufacturing.

1.2 This practice may be used to develop or evaluate an education program for characterization in the nanotechnology field. It provides listings of key methods that are relevant to such a program, with a minimum number of these methods to be taught as a requirement for such an education. This practice does not provide specific course material to be used in such a program.

1.3 While no units of measurements are used in this practice, values stated in SI units are to be regarded as standard.

1.4 This standard does not purport to address all of the characterization methods for nanometer-scale materials, nor is it meant for use in certification processes. It is the responsibility of the user of this standard to utilize other knowledge and skill objectives as applicable to local conditions or required by local regulations.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.