Rules for the preparation of detail specifications for semiconductor devices of assessed quality: p-i-n microwave active switching diodes.

UNGÜLTIG herausgegeben am 1.4.1976

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave Gunn oscillators (c.w. operation).

UNGÜLTIG herausgegeben am 15.9.1977

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave Gunn oscillators (pulse operation).

UNGÜLTIG herausgegeben am 15.9.1977

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave avalanche oscillators (c.w. operation).

UNGÜLTIG herausgegeben am 15.10.1977

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave avalanche oscillators (pulse operation).

UNGÜLTIG herausgegeben am 15.10.1977

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: varactor diodes for frequency multiplication.

UNGÜLTIG herausgegeben am 1.12.1988

Tests for geometrical properties of aggregates. Determination of particle size distribution. Sieving method.

UNGÜLTIG herausgegeben am 15.3.2006

Tests for geometrical properties of aggregates. Assessment of fines. Grading of fillers (air-jet sieving).

UNGÜLTIG herausgegeben am 15.5.2001

Tests for geometrical properties of aggregates. Determination of particle size distribution. Test sieves, nominal size of apertures.

UNGÜLTIG herausgegeben am 15.6.1996

Tests for geometrical properties of aggregates. Determination of particle shape. Flakiness index.

UNGÜLTIG herausgegeben am 26.2.2004