Rules for the preparation of detail specifications for semiconductor devices of assessed quality: low frequency, low power transistors.

UNGÜLTIG herausgegeben am 1.1.1982

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high frequency, low power transistors.

UNGÜLTIG herausgegeben am 15.1.1971

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high power transistors for linear applications.

UNGÜLTIG herausgegeben am 1.5.1976

Banking. Banking telecommunication messages. Bank identifier codes.

UNGÜLTIG herausgegeben am 15.10.1997

Banking. Banking telecommunication messages. Business identifier code (BIC).

UNGÜLTIG herausgegeben am 31.1.2010

Banking. Banking telecommunication messages. Business identifier code (BIC).

UNGÜLTIG herausgegeben am 31.12.2014

Optics and optical instruments. Contact lenses. Determination of cytotoxicity of contact lens material. Agar overlay test and growth inhibition test.

UNGÜLTIG herausgegeben am 15.12.1999

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high power transistors for switching applications.

UNGÜLTIG herausgegeben am 1.1.1982

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: switching transistors.

UNGÜLTIG herausgegeben am 1.1.1982

Detail specification for low power silicon n-p-n switching transistors. 20 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level.

UNGÜLTIG herausgegeben am 15.7.1978