Tests for general properties of aggregates. Procedure and terminology for simplified petrographic description.

UNGÜLTIG herausgegeben am 26.2.2004

Tests for general properties of aggregates. Common equipment and calibration.

UNGÜLTIG herausgegeben am 15.2.2000

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave mixer diodes (c.w. operation).

UNGÜLTIG herausgegeben am 29.10.1971

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave mixer diodes (pulse operation).

UNGÜLTIG herausgegeben am 8.2.1971

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave detector diodes.

UNGÜLTIG herausgegeben am 5.2.1971

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: p-i-n microwave passive limiter diodes.

UNGÜLTIG herausgegeben am 30.4.1990

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: p-i-n microwave active switching diodes.

UNGÜLTIG herausgegeben am 1.4.1976

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave Gunn oscillators (c.w. operation).

UNGÜLTIG herausgegeben am 15.9.1977

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave Gunn oscillators (pulse operation).

UNGÜLTIG herausgegeben am 15.9.1977

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave avalanche oscillators (c.w. operation).

UNGÜLTIG herausgegeben am 15.10.1977