Tests for geometrical properties of aggregates. Assessment of fines. Sand equivalent test.

UNGÜLTIG herausgegeben am 15.7.1999

Tests for geometrical properties of aggregates. Assessment of fines. Methylene blue test.

UNGÜLTIG herausgegeben am 15.4.1999

Tests for geometrical properties of aggregates. Assessment of fines. Methylene blue test.

UNGÜLTIG herausgegeben am 30.4.2013

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: low current rectifier diodes (up to 3 ampere rating).

UNGÜLTIG herausgegeben am 30.9.1969

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: medium current rectifier diodes (1-100 ampere rating).

UNGÜLTIG herausgegeben am 30.9.1969

Detail specification for medium current rectifier diodes. 3 A, 300 V, 600 V, 900 V, 1200 V, hermetically sealed. Full assessment level.

UNGÜLTIG herausgegeben am 15.6.1974

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high current rectifier diodes (greater than 50 ampere rating).

UNGÜLTIG herausgegeben am 29.5.1970

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: controlled avalanche rectifier diodes.

UNGÜLTIG herausgegeben am 12.1.1972

Dentistry. Brazing materials.

UNGÜLTIG herausgegeben am 30.11.2006

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: rectifier bridges. Ambient rated, single phase, in solid (plastics) encapsulation.

UNGÜLTIG herausgegeben am 15.10.1977