Normen IEEE - Progressive Technologie für Menschen - Seite Nr. 254

IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data

UNGÜLTIG herausgegeben am 1.9.1999

IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments

UNGÜLTIG herausgegeben am 30.9.2005

IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification

UNGÜLTIG herausgegeben am 18.3.2003

IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification

UNGÜLTIG herausgegeben am 7.9.2007

IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)

UNGÜLTIG herausgegeben am 5.4.2006

IEEE Standard for Describing On-Chip Scan Compression

UNGÜLTIG herausgegeben am 13.7.2009

IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Common Functions, Communication Protocols, and Transducer Electronic Data Sheet (TEDS) Formats

UNGÜLTIG herausgegeben am 21.9.2007

IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Network Capable Application Processor Information Model

UNGÜLTIG herausgegeben am 18.4.2000

IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Transducer to Microprocessor Communication Protocols and Transducer Electronic Data Sheet (TEDS) Formats

UNGÜLTIG herausgegeben am 25.9.1998

IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Digital Communication and Transducer Electronic Data Sheet (TEDS) Formats for Distributed Multidrop Systems

UNGÜLTIG herausgegeben am 31.3.2004