Compound semiconductive single crystals--Determination of crzystallographic orientation--X-ray diffraction method

UNGÜLTIG herausgegeben am 1.1.1988

Gallium arsenide single crystal—Determination of dislocation density

UNGÜLTIG herausgegeben am 25.2.1988

Gallium arsenide single crystal—Determination of dislocation density

UNGÜLTIG herausgegeben am 18.7.2006

Determination of particle size distribution of yttrium oxide and europium oxide by sedimentation and light obscuration method

UNGÜLTIG herausgegeben am 25.2.1988

Yttrium oxide and europium oxide of phosphor grade—Determination of total rare earth oxide content—EDTA volumetric method

UNGÜLTIG herausgegeben am 25.2.1988

Yttrium oxide and europium oxide of phosphor grade—Determination of calcium oxide content—N2O-C2H2 flame atomic absorption spectrophotometric method

UNGÜLTIG herausgegeben am 25.2.1988

Yttrium oxide of phosphor grade--Determination of acid soluble silicon dioxide--Molybdenum blue photometric method

UNGÜLTIG herausgegeben am 25.2.1988

Yttrium oxide of phosphor grade--Determination of iron oxide, lead oxide, nickel oxide and copper oxide contents--Emission spectrographic method

UNGÜLTIG herausgegeben am 25.2.1988

Yttrium oxide of phosphor grade—Determination of trace rare earth oxide contents—Spectrochemical method and direct spectrographic method

UNGÜLTIG herausgegeben am 25.2.1988

Europium oxide of phosphor grade--Determination of lead oxide, nickel oxide, iron oxide and copper oxide contents--Emission spectrographic method

UNGÜLTIG herausgegeben am 25.2.1988