Normen UNE - Spanische nationale Normen - Seite Nr. 1561

Aerospace series. Elements of electrical and optical connection. Test methods. Part 6323: Optical elements. Thermal shock (Hermetically sealed devices) (Endorsed by AENOR in August of 2002.)

Die Norm herausgegeben am 1.8.2002

Aerospace series. Elements of electrical and optical connection. Test methods. Part 6324: Optical elements. Interfacial sealing (Endorsed by AENOR in February of 2002.)

Die Norm herausgegeben am 1.2.2002

Aerospace series. Elements of electrical and optical connection. Test methods. Part 6401: Optical elements. Aceleration steady state (Endorsed by AENOR in February of 2002.)

Die Norm herausgegeben am 1.2.2002

Aerospace series. Elements of electrical and optical connection. Test methods. Part 6402: Optical elements. Shock (Endorsed by AENOR in February of 2002.)

Die Norm herausgegeben am 1.2.2002

Aerospace series. Elements of electrical and optical connection. Test methods. Part 6403: Optical elements. Vibrations (Endorsed by AENOR in February of 2002.)

Die Norm herausgegeben am 1.2.2002

Aerospace series- Elements of electrical and optical connection- Test methods- Part 6404: Optical elements- Transverse load (Endorsed by AENOR in February of 2002.)

Die Norm herausgegeben am 1.2.2002

Aeroespace series. Elements of electrical and optical connection. Test methods. Part 6405: Optical elements. Axial load (Endorsed by AENOR in February of 2002.)

Die Norm herausgegeben am 1.2.2002

Aerospace series. Elements of electrical and optical connection. Test methods. Part 6406: Optical elements. Mechanical endurance (Endorsed by AENOR in February of 2002.)

Die Norm herausgegeben am 1.2.2002

Aerospace series. Elements of electrical and optical connection. Test methods. Part 6414: Optical elements. Unmating of lanyard release optical connection elements (Endorsed by AENOR in February of 2002.)

Die Norm herausgegeben am 1.2.2002

Aerospace series. Elements of electrical and optical connection. Test methods. Part 6415: Optical elements. Test probe damage (Endorsed by AENOR in February of 2002.)

Die Norm herausgegeben am 1.2.2002