Normen UNE - Spanische nationale Normen - Seite Nr. 5873

Discrete semiconductor devices -- Part 15: Isolated power semiconductor devices (Endorsed by AENOR in May of 2004.)

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Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

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Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock.

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Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

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Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

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Semiconductor devices - Mechanical and climatic test methods -- Part 15: Resistance to soldering temperature for through-hole mounted devices

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Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices

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Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

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Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

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Semiconductor devices - Mechanical and climatic test methods -- Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat

UNGÜLTIG herausgegeben am 11.6.2004