Normen UNE - Spanische nationale Normen - Seite Nr. 5874

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

UNGÜLTIG herausgegeben am 6.10.2023

Semiconductor devices - Mechanical and climatic test methods -- Part 21: Solderability (Endorsed by AENOR in August of 2005.)

UNGÜLTIG herausgegeben am 12.5.2014

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

UNGÜLTIG herausgegeben am 15.4.2017

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by AENOR in July of 2014.)

UNGÜLTIG herausgegeben am 20.2.2021

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Espanola de Normalización in August of 2017.)

UNGÜLTIG herausgegeben am 6.4.2025

Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test

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Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

UNGÜLTIG herausgegeben am 30.5.2003

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

UNGÜLTIG herausgegeben am 2.11.2005

Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling

UNGÜLTIG herausgegeben am 16.3.2005

Semiconductor devices - Mechanical and climatic test methods -- Part 37: Board level drop test method using an accelerometer (Endorsed by AENOR in July of 2008.)

UNGÜLTIG herausgegeben am 17.11.2025